Fig. 2
From: Protein Adsorption on Nano-scaled, Rippled TiO2 and Si Surfaces
a Wavelength dependency of the ripple pattern on the ion energy for TiO2. The wavelength of the created ripples follows a power law dependence with increasing ion energy. Theinset shows an AFM picture of TiO2 irradiated with 7 keV Xe ions and an ion fluence of 3 × 1016 cm−2. b Contact angles of water on flat and rippled TiO2 as a function of the reciprocal ripple wavelength. In comparison to non-irradiated and flat TiO2 (triangle), the contact angle increases slightly from 60.9° ± 3.2° to 65.1° ± 12.0° for irradiated and flat TiO2. The values for rippled TiO2 exhibit larger error bars because of a smaller irradiation area in comparison to the flat TiO2 that could be investigated